SXD technical information old

Info to help with operating the instrument

 

SXD - Single Crystal Diffractometer
BeamlineS3
ModeratorAmbient water, poisoned at 2 cm
Incident wavelengths

0.2 - 10Å

sin θ/ζ

0.03 - 2.5Å-1

Resolution

Δd/d ~ 0.5% (backscattering) - 1% (90 degrees)

Sample position

8.3m from moderator

Beam size at sample

< 15 mm diameter

Sample size

Dependent on scattering characteristics and unit cell size, at least 1 mm3 and typically 100 mm3

Data collection time

Typically 1 - 2 hours per crystal orientation

Position-sensitive detectors

Eleven 64 x 64 pixel optically encoded ZnS scintillators each with 192 × 192 mm2 active area and 3 × 3 mm2 resolution

Detector positions (centres)

L2 = 0.225m in equatorial plane at longitude = ±37.5°, ±90°, ±142.5°;
L2 = 0.27m at latitude = 45°, longitude = 0°, ±90°, 180°;
L2 = 0.28m at latitude = -90°, longitude = 0°

Diffractometer motion

w rotation available on vacuum tank, cryostat and furnace. 2-circle (Χ - Φ) orienter with CCR

Sample environment

Standard sample environments plus the following SXD specific items:
Liquid He Orange cryostat (1.5 - 300K)
Displex cooler (12 - 300K)
Furnace (300 - 1200K)
Cryostat with 3He dilution insert: 300 mK – 300 K and omega rotation

Data acquisition and analysisWindows PC. Labview based instrument control software. Analysis program SXD2001 for initial data visualisation, reduction to structure factors including data corrections, fully corrected volumes in reciprocal space. Supported structure refinement packages: SHELX, GSAS, FULLPROF
 

 
 

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