SXD technical information

Technical specifications

Technical Summary

BeamlineS3
ModeratorAmbient water, poisoned at 2 cm
Incident wavelengths0.2 - 10Å
Sin Θ/λ0.03 - 2.5Å-1
ResolutionΔd/d ~ 0.5% (backscattering) - 1% (90 degrees)
Sample position8.3m from moderator
Beam size at sample< 15 mm diameter
Sample sizeDependent on scattering characteristics and unit cell size, at least 1 mm3 and typically 100 mm3
Data collection timeTypically 1 - 2 hours per crystal orientation
Position-sensitive detectorsEleven 64 x 64 pixel optically encoded ZnS scintillators each with 192 × 192 mm2 active area and 3 × 3 mm2 resolution
Detector positions (centre)L2 = 0.225m in equatorial plane at longitude = ±37.5°, ±90°, ±142.5°;
L2 = 0.27m at latitude = 45°, longitude = 0°, ±90°, 180°;
L2 = 0.28m at latitude = -90°, longitude = 0°.
Diffractometer motionω rotation available on vacuum tank, cryostat and furnace. 2-circle (χ - φ) orienter with CCR
Sample environmentStandard sample environments plus the following SXD specific items:
Liquid He Orange cryostat (1.5 - 300K)
Displex cooler (12 - 300K)
Furnace (300 - 1200K)
Cryostat with 3He dilution insert: 300 mK – 300 K and omega rotation
Data acquisition and analysisWindows PC. Labview based instrument control software. Analysis program SXD2001 for initial data visualisation, reduction to structure factors including data corrections, fully corrected volumes in reciprocal space. Supported structure refinement packages: SHELX, GSAS, FULLPROF
Skip to the top of the page