Bruker Atomic Force Microscope

Atomic Force Microscope (AFM)

Bruker - Dimension 3100 Scanning Probe Microscope

The Atomice Force Microscope (AFM)

The Atomice Force Microscope (AFM) in the R53 Material Characterisation Lab
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Accepts samples up to 200mm for semiconductor wafers, lithography masks, magnetic media, CDs/DVDs, biomaterials, and conducts both standard and advanced SPM imaging.

Our AFM instrument is also available to use in the Magnetic Force Microscopy (MFM) mode. This is a secondary imaging mode derived from TappingMode mode that maps magnetic force gradient above the sample surface.

For enquiries regarding the AFM or to request time, please e-mail the Lab Manager.

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