Scanning probe microscopy measurements can be done at ISIS using the Dimension 3100, housed in the Materials Characterisation Laboratory.
The instrument will accept samples such as semiconductor wafers, lithography masks, magnetic media eg. CDs & DVDs, biomaterials and thin films up to 200 mm in diameter.
The instrument is typically used for Tapping Mode atomic force microscopy imaging, however with a simple magnetisation of the probe tip and changing some software settings, magnetic force microscopy (MFM) measurements are possible as well. With this mode you can map magnetic force gradients and features at the sample surface, as well as a physical height scan simultaneously.