Chipir publications
18 Sep 2009



Recent publications and documentation


Downloads: ChipIR briefing document

Beamline design and characterization 

  1. C. Frost, et al. “A new dedicated neutron facility for accelerated SEE testing at the ISIS facility." Reliability Physics Symposium, 2009 IEEE International. IEEE, 2009.
  2. Carlo Cazzaniga, Simon P. Platt and Christopher D. Frost, “Preliminary Results of ChipIr, a new Atmospheric-like Neutron Beamline for the Irradiation of Microelectronics",  proceeding of the SELSE-13: “The 13th Workshop on Silicon Errors in Logic – System Effects",21-22 March 2017, Northeastern University, Boston, Massachusetts (USA).
  3. C. Cazzaniga and C. D. Frost, “Progress of the Commissioning of a fast neutron beamline for Chip Irradiation",  proceeding of the 22nd meeting of the International Collaboration on Advanced Neutron Sources (ICANS XXII), held on the 27th -31st March 2017 in Oxford, England​


Fast neutron instrumentation

  1. Cazzaniga, C., Rebai, M., Lopez, J.G., Jimenez-Ramos, M.C., Girolami, M., Trucchi, D.M., Bellucci, A., Frost, C.D., Garcia-Munoz, M., Nocente, M. and Tardocchi, M., 2017. Charge collection uniformity and irradiation effects of synthetic diamond detectors studied with a proton micro-beam. Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms, 405, pp.1-10.
  2. Cazzaniga, C., Frost, C. D., Minniti, T., Schooneveld, E., Cippo, E. P., Tardocchi, M., ... & Gorini, G. (2016). Characterization of the high-energy neutron beam of the PRISMA beamline using a diamond detector. Journal of Instrumentation, 11(07), P07012.
  3. Feng, S., et al. "Response of a telescope proton recoil spectrometer based on a YAP: Ce scintillator to 5–80 MeV protons for applications to measurements of the fast neutron spectrum at the ChipIr irradiation facility." Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment (2017).


Chip Irradiation 

  1. N. Marchese et al., “Investigation on the Single Event Burnout threshold behaviour of Power MOSFETs under atmospheric-like neutron spectrum irradiation", contribution to the RADECS 2017 conference.
  2. Jain et al., "A Low Cost Robust Radiation Hardened Flip-Flop Circuit" TENCON 2017 - 2017 IEEE Region 10 Conference
  3. Cazzaniga et al., “Accelerated Neutron Testing with Multiple Printed Circuit Boards: Flux and Spectrum Modifications" RADECS 2017 conference, submitted for publication on  IEEE Transactions on Nuclear Science.
  4. dos Santos, Fernando Fernandes, et al. "Evaluation and Mitigation of Soft-Errors in Neural Network-Based Object Detection in Three GPU Architectures." Dependable Systems and Networks Workshop (DSN-W), 2017 47th Annual IEEE/IFIP International Conference on. IEEE, 2017.
  5. C. Lunardi et al., “On the Efficacy of ECC and the Benefit of FinFET Transistors Layout in GPUs Reliability" RADECS 2017 conference, submitted for publication on  IEEE Transactions on Nuclear Science.
  6. Fedi et al., “High-energy Neutrons Characterization of a Safety Critical Computing System" IEEE Symp. Defect and Fault Tolerance in VLSI and Nanotechnology Systems in Cambridge UK, 2017.