Register your interest for the below workshop here, this event is STFC supported and there are no registration fees.
With the imminent introduction of self driving cars in the global market questions regarding the reliability of component and systems arise This short (2-day) workshop aim at putting together experts from academia, automotive vendors, and chip designers working from transistor-level to system and application-level reliability Our goal is to stimulate the discussion and create a network to evaluate the reliability issue and find novel solution to mitigate faults effects in automotive applications.
Speakers so far
- Robert Baumann (Texas Instruments)
- Sudhanva Gurumurthi (AMD)
- Richard Bramley (NVIDIA)
- Riccardo Mariana (Intel)
- Chris Frost/Carlo Cazzaniga (ChipIr - Rutherford Appleton Laboratory)
- Paolo Rech (Associate Professor at Fereral University of Rio Grande do Sul, Brazil)
- Basic Mechanisms (neutron-silicon interaction, interferences, perturbation)
- Standards and Measurements (ISO, FIT, beam and fault-injection, errors criticality)
- Accelerators (GPU, FPGA, ....)
- Applications (neural networks, image processing, decision making)
- Components (power transistors, sensors)
- Hardening Solutions (HW/SW replicas, checkpoint, detection, transistor hardening)
Also taking place
Tour of ChipIr at ISIS - there will be an opportunity to visit the new ChipIr neutron radiation facility at the ISIS Neutron and Muon source during the workshop.
Students forum - students have the chance to present their work and have feedback from experts in the reliability research field
Round table - a round table will be organized to discuss possible collaborations and how to avance the knowledge on reliability for self-driving cars.