Overview
Scanning probe microscopy measurements can be done at ISIS using the Dimension 3100, housed in the Materials Characterisation Laboratory. The instrument will accept a variety of samples such as semiconductor wafers, lithography masks and magnetic media.
Common Research Applications
Specifications
Measures sample sizes of 150 mm diameter and 12 mm thickness
Stage movement in xy of 150 mm with 2 μm resolution
Video optics with zoom 150 – 675 μm viewing area
Piezo scan head range of 90 μm in xy and 6 μm in z
Sub nanometre resolution
Maximum 512 × 512 samples/image
Measurement Package
The instrument is typically used for Tapping Mode atomic force microscopy imaging, however with a simple magnetisation of the probe tip and changing some software settings, magnetic force microscopy measurements are possible as well. With this mode you can map magnetic force gradients and features at the sample surface, as well as a physical height scan simultaneously.
Measurement Options
Dimension 3100 Brochure
