Bruker Veeco Dimension 3100
02 Mar 2015
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Scanning probe microscopy measurements can be done at ISIS using the Dimension 3100, housed in the Materials Characterisation Laboratory.
The instrument will accept samples  such as semiconductor wafers, lithography masks, magnetic media eg. CDs & DVDs, b

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The atomic force microscope in the Materials Characterisation Laboratory.
 
The atomic force microscope in the Materials Characterisation Laborato

The atomic force microscope in the Materials Characterisation Laboratory.
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The instrument is typically used for Tapping Mode atomic force microscopy imaging, however with a simple magnetisation of the probe tip and changing some software settings, magnetic force microscopy (MFM) measurements are possible as well. With this mode you can map magnetic force gradients and features at the sample surface, as well as a physical height scan simultaneously.

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