Rigaku SmartLab
01 Jan 2021





​​​​​​The Rigaku SmartLab X-ray diffractometer 1 and 2 (Powder and Thin film in-plane systems) in the Materials Characterisation Laboratory​​​​​​​​​​​



The Rigaku Smartlab is a state-of-the-art X-ray diffractometer, also capable of acting as a reflectometer with a variety of sample environments and optical configurations. The instrument provides high resolution data at a fast rate using a high brilliance rotating anode source.​

Common Research Applications​

  • Composition identification

  • Crystal orientation

  • High resolution XRD

  • In-plane diffraction

  • Polymorphs

  • Powder crystallography

  • Qualitative and quantitative analysis

  • Rietveld analysis

  • Residual stress analysis

  • High and low temperature XRD

  • Thin film analysis

  • X-ray reflectometry​



  • High intensity X-ray generation provided by a 9 kW rotating Cu anode

  • High resolution θ/θ closed loop goniometer drive system

  • In-plane scattering capability

  • Cross-beam optics (CBO), Ge 2-bounce and 4-bounce monochromators and an automatic variable divergence slit incidence optics

  • Automatic variable scattering slit PSA, Ge 2-bounce analyzer, and automatic variable receiving slit receiving optics

  • Other optics options, for example Soller slits (open and various degrees), PSAs (open and various degrees), beam length varying slits and a vacuum path section

  • HyPix2D (2D), D/tex Ultra 250 (1D) silicon strip and a (0D) scintillation counter detectors available​


Measurement Packages​

A number of measurement types can be performed on the SmartLab, including but not limited to:

  • Low, medium and high-resolution

  • Grazing-incidence small-angle scattering (GISAXS)

  • Reflectometry (XRR)

  • Reciprocal Space Maps (RSM)

  • Pole figures​


Sample Environment​

  • Anton Parr HTK hot stage for measurements from temperatures of 25 to 1200 °C under vacuum or inert gas, with an optional capillary extension.

  • Oxford Phenix cold stage to reach sample temperatures as low as 12 K, under vacuum.

  • Oxford Phenix Front Loading cryostat 40-300 K (Cold loading)

  • Attachment for air-sensitive samples

  • 6-position autosampler and X-Y position stage for general powder and thin-film XRD and reflectivity (XRR) measurements

  • Sample stage for in-situ use of reactive gases​


Ease of Use​

The instrument is controlled with the SmartLab Guidance software, which can guide users thorough the setting up of the instrument itself to preparing and executing a measurement, in a step-by-step manner. Ready-to-run measurement packages make it straightforward to get started with experiments, whilst custom analysis procedures can be programmed to take care of multiple measurements and conditions for the more advanced user. Tracked hardware parts make it simple to setup the correct X-ray optics for your experiment.

Post-experiment results processing is available with the PDXL powder diffraction analysis software suite, capable of automatic phase identification, quantitative analysis, lattice constants refinement, Rietveld analysis, ab initio structure determination and access to the Crystallography Open Database (COD).​

​Manufacturer's website