Rigaku SmartLab
25 Feb 2015



The Rigaku Smartlab is available for use by all ISIS staff, users and collaborators for characterisation of materials, including pre- and post-beamline experiments.

The Rigaku SmartLab X-ray diffractometer.


The SmartLab is our in-house state-of-the-art X-ray diffractometer, also capable of acting as a reflectometer. Features include:

  • High intensity X-ray generation provided by a 9 kW rotating Cu anode
  • High resolution θ/θ closed loop goniometer drive system
  • In-plane scattering capability
  • Cross-beam optics (CBO), Ge 2-bounce and 4-bounce monochromators and an automatic variable divergence slit incidence optics
  • Automatic variable scattering slit PSA, Ge 2-bounce analyzer, and automatic variable receiving slit receiving optics
  • Other optics options, for example Soller slits (open and various degrees), PSAs (open and various degrees), beam length varying slits and a vacuum path section
  • Both the D/tex Ultra 250 1D silicon strip detector and a scintillation counter detector available

Measurement Packages

A number of measurement types can be performed on the SmartLab, including but not limited to:

  • Low, medium and high-resolution
  • Small angle X-ray scattering (SAXS)
  • Grazing-incidence small-angle scattering (GISAXS)
  • Ultra-small angle X-ray scattering (USAXS)
  • Reflectometry (XRR)
  • Reciprocal Space Maps (RSM)
  • Pole figures

Sample Environment

  • Anton Parr HTK hot stage for measurements from temperatures of 25 to 1200 °C under vacuum or inert gas, with an optional capillary extension
  • Oxford Phenix cold stage to reach sample temperatures as low as 12 K, under vacuum
  • Capillary attachment for SAXS/USAXS and air-sensitive samples
  • 6-position autosampler for general powder and thin-film XRD and X-ray reflectivity (XRR) measurements
  • Sample stage for in-situ use of reactive gases
  • Sample cell for a humidity environment or for air-sensitive samples

Ease of Use

The instrument is controlled with the SmartLab Guidance software, which can guide users thorough the setting up of the instrument itself to preparing and executing a measurement, in a step-by-step manner. Ready-to-run measurement packages make it straightforward to get started with experiments, whilst custom analysis procedures can be programmed to take care of multiple measurements and conditions for the more advanced user. Tracked hardware parts make it simple to setup the correct X-ray optics for your experiment.

Post-experiment results processing is available with the PDXL powder diffraction analysis software suite, capable of automatic phase identification, quantitative analysis, lattice constants refinement, Rietveld analysis, ab initio structure determination and access to the Crystallography Open Database (COD).

Manufacturer's website