In this section
SXD
SXD is a dedicated single crystal diffractometer using the time-of-flight Laue technique to record large volumes in reciprocal space. The sample chamber is surrounded by 11 area detectors covering roughly the surface of a half sphere of diameter about 45 cm. This enables parametric studies of small molecules, inorganic and magnetic structures including diffuse scattering with sample sizes >1mm3
Instrument scientists
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Technical information
- Ambient-temperature water moderator
- Primary flight path (L1) of 8.3 m
- Secondary flight path (L2) ranging from 215 – 270 mm
- Wavelength range of 0.3 – 10 Å
- 11 area detectors comprising approximately 45000 pixels of size 3 x 3 mm2
Related resources
Sample environment
- Bottom-loading CCR (T from 20 – 400 K)
- Top-loading CCR (T from 4 – 300 K)
- Orange cryostat (T from 1.5 – 300 K)
- Heliox cryostat with 3He sorb insert (T from 0.3 – 300 K)
- Furnace (room temperature to 1230 K)
- Compact 10 kN stress/strain rig that can be used between 230 – 500 K
- Near-IR (780 nm) and green (532 nm) light Raman spectrometer that can record spectra while the sample is sitting in the neutron beam to monitor phase transitions or to study chromic and photo-excitable materials
- Electric field centre stick up to 30kV with polarity switch and current limiter
- High-pressure null-scattering TiZr alloy gas cell, 2 or 3 mm internal diameter, Pmax = 5 kbar, T = 5 – 300 K.
Software
– Mantid
– SXD2001, available upon request
– DIALS for neutrons
Recent publications
Instrument reference
All publications and datasets based on experiments using SXD should cite that the data is collected by DOI: 10.5286/isis.instrument.8616. Experiment DOIs follow the format 10.5286/ISIS.E.RBXXXXXXX, where XXXXXXX is the 7-digit experiment (RB) number and these can be viewed via the Data Gateway.