In this section
SXD
SXD is a dedicated single crystal diffractometer using the time-of-flight Laue technique to record large volumes in reciprocal space. The sample chamber is surrounded by 11 area detectors covering roughly the surface of a half sphere of diameter about 45 cm.
Instrument scientists
To find out more about each team member, click the + symbol.
Technical information
- Ambient-temperature water moderator
- Primary flight path (L1) of 8.3 m
- Secondary flight path (L2) ranging from 215 – 270 mm
- Wavelength range of 0.3 – 10 Å
- 11 area detectors comprising approximately 45000 pixels of size 3 x 3 mm2
Related resources
Sample environment
- Bottom-loading CCR (T from 20 – 400 K)
- Top-loading CCR (T from 4 – 300 K)
- Orange cryostat (T from 1.5 – 300 K)
- Heliox cryostat with 3He sorb insert (T from 0.3 – 300 K)
- Furnace (room temperature to 1230 K)
- Compact 10 kN stress/strain rig that can be used between 230 – 500 K
- “Red” and “green” light Raman spectrometer that can record spectra while the sample is sitting in the neutron beam to monitor phase transitions or to study chromic and photo-excitable materials
- Electric field centre stick up to 30kV with polarity switch and current limiter
Software
– Mantid
– SXD2001, available upon request
– DIALS for neutrons
Recent publications
Instrument reference
All publications and datasets based on experiments using SXD should cite that the data is collected by DOI: 10.5286/isis.instrument.8616. Experiment DOIs follow the format 10.5286/ISIS.E.RBXXXXXXX, where XXXXXXX is the 7-digit experiment (RB) number and these can be viewed via the Data Gateway.