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Techniques at ISIS

The ISIS targets are surrounded by a series of neutron scattering and muon instruments. These instruments enable research using a range of techniques.

A woman loading a sample

Explore our techniques

Elemental analysis

Elemental analysis technique is used to determine, qualitatively and/or quantitatively, the elemental/isotopic composition and spatial 2D/3D distribution in any material.

Irradiation

Looks at how samples, such as electronics, respond to cosmic neutron radiation.

Muon spectroscopy

Provides a probe of materials at an atomic level.

Neutron diffraction

Neutron diffraction instruments are used to provide detailed insights into the arrangement of atoms within a material, helping scientists to understand its properties and behaviour. Neutron diffraction can be applied to study crystalline solids, gasses, liquids or amorphous materials.

Neutron imaging

Designed for a broad range of materials science areas where non‑destructive and in-situ testing is required, imaging provides neutron radiography, tomography, strain scanning and texture analysis capabilities.

Neutron reflectometry

Reflectivity is the ratio of the reflected intensity to the incident intensity for a beam directed onto an interface or surface. The technique of neutron reflectometry provides valuable information over a wide variety of scientific and technological applications including polymer and surfactant adsorption, structure of thin film magnetic systems, and biological membranes.

Neutron spectroscopy

Neutron spectroscopy is an excellent way to study the dynamics of atoms and molecules. It measures the change in the energy of the neutron as it scatters off a sample and can be used to probe a variety of phenomena such as the motions of atoms, rotational modes of molecules, magnetic and quantum excitations and even electronic transitions.

Small-angle neutron scattering

Small-angle neutron scattering (SANS) is a technique for examining bulk materials at length scales ranging from 0.5 nanometres to several hundred nanometres.